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Refereed Publications – 2017
- V. P. Yanambaka, S. P. Mohanty, E. Kougianos, D. Ghai, and G. Ghai, “Process Variation Analysis and Optimization of a FinFET based VCO“, IEEE Transactions on Semiconductor Manufacturing (TSM), Volume 30, Issue 02, May 2017, pp. 126-134.